Issued Patents All Time
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12339202 | Method of failure analysis for defect locations | Qiang Chen | 2025-06-24 |
| 11852674 | Method for locating open circuit failure point of test structure | Cheng-An Wu, Shuqing Duan | 2023-12-26 |
| 11315755 | Method for preparing a TEM sample | Qiang Chen, Yanrong Qiu | 2022-04-26 |