Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6236225 | Method of testing the gate oxide in integrated DMOS power transistors and integrated device comprising a DMOS power transistor | Franco Bertotti, Bruno Murari | 2001-05-22 |
| 5350998 | Structure for temperature compensating the inverse saturation current of bipolar transistors | Fabio Marchio, Giorgio Rossi | 1994-09-27 |