Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8921013 | System and method for test pattern for lithography process | Chi-Yuan Hung, Bin Zhang, Li Zhang | 2014-12-30 |
| 8501376 | System and method for test pattern for lithography process | Chi-Yuan Hung, Bin Zhang, Li Zhang | 2013-08-06 |