WR

Wei Wei Ruan

S( Semiconductor Manufacturing International (Shanghai): 3 patents #213 of 1,122Top 20%
Overall (All Time): #1,551,797 of 4,157,543Top 40%
3
Patents All Time

Issued Patents All Time

Showing 1–3 of 3 patents

Patent #TitleCo-InventorsDate
8323990 Reliability test structure for multilevel interconnect Wen Shi 2012-12-04
8164091 Multi-purpose poly edge test structure Wen Shi 2012-04-24
7439538 Multi-purpose poly edge test structure Wen Shi 2008-10-21