Issued Patents All Time
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7619435 | Method and system for derivation of breakdown voltage for MOS integrated circuit devices | Atman Zhao, Summer Tseng, Excimer Gong | 2009-11-17 |
| 7573285 | Multiple point gate oxide integrity test method and system for the manufacture of semiconductor integrated circuits | Atman Zhao, Summer Tseng, Excimer Gong | 2009-08-11 |
| 7396693 | Multiple point gate oxide integrity test method and system for the manufacture of semiconductor integrated circuits | Atman Zhao, Summer Tseng, Excimer Gong | 2008-07-08 |