JF

Jiunhau Fu

S( Semiconductor Manufacturing International (Shanghai): 1 patents #561 of 1,122Top 50%
Overall (All Time): #3,120,083 of 4,157,543Top 80%
1
Patents All Time

Issued Patents All Time

Showing 1–1 of 1 patents

Patent #TitleCo-InventorsDate
8804100 Method and system for calibrating exposure system for manufacturing of integrated circuits Cher Huan Tan 2014-08-12