GB

Gong Bin

S( Semiconductor Manufacturing International (Shanghai): 3 patents #213 of 1,122Top 20%
Overall (All Time): #1,575,367 of 4,157,543Top 40%
3
Patents All Time

Issued Patents All Time

Showing 1–3 of 3 patents

Patent #TitleCo-InventorsDate
7521955 Method and system for device characterization with array and decoder — 2009-04-21
7345500 Method and system for device characterization with array and decoder — 2008-03-18
7135868 Method and apparatus for testing gate oxide with fuse — 2006-11-14