Issued Patents All Time
Showing 26–27 of 27 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8552712 | Current measurement method, inspection method of semiconductor device, semiconductor device, and test element group | Kiyoshi Kato, Yutaka Shionoiri, Kazuma Furutani | 2013-10-08 |
| 8542528 | Semiconductor device and method for driving semiconductor device | Kiyoshi Kato | 2013-09-24 |