Issued Patents All Time
Showing 26–42 of 42 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8884470 | Semiconductor device | — | 2014-11-11 |
| 8824194 | Semiconductor device and method for driving the same | Hidetomo Kobayashi, Yutaka Shionoiri | 2014-09-02 |
| 8816722 | Current detection circuit | — | 2014-08-26 |
| 8754693 | Latch circuit and semiconductor device | — | 2014-06-17 |
| 8698521 | Semiconductor device | — | 2014-04-15 |
| 8674738 | Semiconductor device | — | 2014-03-18 |
| 8624239 | Semiconductor device | — | 2014-01-07 |
| 8581625 | Programmable logic device | Seiichi Yoneda | 2013-11-12 |
| 8570065 | Programmable LSI | Hidetomo Kobayashi, Masami Endo, Yutaka Shionoiri, Hiroki Dembo, Kazuaki Ohshima +2 more | 2013-10-29 |
| 8540161 | Semiconductor device and method for manufacturing the same | Yutaka Shionoiri, Misako Sato, Shuhei Maeda | 2013-09-24 |
| 8476927 | Programmable logic device | — | 2013-07-02 |
| 8439270 | Semiconductor device and wireless tag using the same | — | 2013-05-14 |
| 8340457 | Image analysis method, image analysis program and pixel evaluation system having the sames | Masahiko Hayakawa | 2012-12-25 |
| 8311315 | Pattern inspection method and apparatus | Teppei Oguni, Akiharu Miyanaga | 2012-11-13 |
| 8184923 | Image analysis method, image analysis program, pixel evaluation system having the image analysis method, and pixel evaluation system having the image analysis program | Masahiko Hayakawa | 2012-05-22 |
| 7970200 | Pattern inspection method and apparatus | Teppei Oguni, Akiharu Miyanaga | 2011-06-28 |
| 7769226 | Pattern inspection method and apparatus | Teppei Oguni, Akiharu Miyanaga | 2010-08-03 |