Issued Patents All Time
Showing 1–12 of 12 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9261554 | Semiconductor device, manufacturing method thereof, and measuring method thereof | Takuya Tsurume | 2016-02-16 |
| 8822272 | Semiconductor device, manufacturing method thereof, and measuring method thereof | Takuya Tsurume | 2014-09-02 |
| 8114719 | Memory device and manufacturing method of the same | Kiyoshi Kato, Tetsuji Yamaguchi, Konami Izumi | 2012-02-14 |
| 7714367 | Semiconductor device and manufacturing method thereof | Saishi Fujikawa, Tatsuya Arao, Takashi Yokoshima, Takuya Matsuo, Hidehito Kitakado | 2010-05-11 |
| 7567882 | Method for evaluating semiconductor device | Kiyoshi Kato, Yutaka Shionoiri, Masahiko Hayakawa | 2009-07-28 |
| 7560293 | Evaluation method using a TEG, a method of manufacturing a semiconductor device having the TEG, an element substrate and a panel having the TEG, a program for controlling dosage and a computer-readable recording medium recording the program | Osamu Nakamura, Masayuki Sakakura | 2009-07-14 |
| 7521368 | Method for manufacturing semiconductor device | Tetsuji Yamaguchi, Naomi Yazaki, Tomoya Futamura, Tomoko Nishikawa | 2009-04-21 |
| 7292955 | Method and apparatus for examining semiconductor apparatus and method for designing semiconductor apparatus | Masahiko Hayakawa, Yoshiko Ikeda | 2007-11-06 |
| 7256079 | Evaluation method using a TEG, a method of manufacturing a semiconductor device having a TEG, an element substrate and a panel having the TEG, a program for controlling dosage and a computer-readable recording medium recoding the program | Osamu Nakamura, Masayuki Sakakura | 2007-08-14 |
| 7231310 | Method for evaluating semiconductor device | Kiyoshi Kato, Yutaka Shionoiri, Masahiko Hayakawa | 2007-06-12 |
| 7202149 | Semiconductor device and manufacturing method thereof | Saishi Fujikawa, Tatsuya Arao, Takashi Yokoshima, Takuya Matsuo, Hidehito Kitakado | 2007-04-10 |
| 7112982 | Method for evaluating semiconductor device | Tatsuya Honda | 2006-09-26 |