Issued Patents All Time
Showing 101–125 of 267 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8329520 | Method for manufacturing semiconductor device using a laser annealing process | Shunpei Yamazaki, Masahiro Takahashi, Takuya Hirohashi | 2012-12-11 |
| 8329506 | Semiconductor device and method for manufacturing the same | Kengo Akimoto, Junichiro Sakata, Takuya Hirohashi, Masahiro Takahashi, Hideyuki Kishida | 2012-12-11 |
| 8319218 | Oxide semiconductor layer and semiconductor device | Shunpei Yamazaki, Masayuki Sakakura, Masahiro Takahashi, Takuya Hirohashi, Takashi Shimazu | 2012-11-27 |
| 8311315 | Pattern inspection method and apparatus | Teppei Oguni, Tatsuji Nishijima | 2012-11-13 |
| 8309961 | Semiconductor device, display device, and electronic appliance | Shunpei Yamazaki, Masayuki Sakakura, Ryosuke Watanabe, Junichiro Sakata, Kengo Akimoto +2 more | 2012-11-13 |
| 8241949 | Method of manufacturing semiconductor device | — | 2012-08-14 |
| RE43450 | Method for fabricating semiconductor thin film | Shunpei Yamazaki, Hisashi Ohtani, Satoshi Teramoto | 2012-06-05 |
| 8168973 | Thin film transistor | Shunpei Yamazaki, Koji Dairiki, Hidekazu Miyairi, Takuya Hirohashi | 2012-05-01 |
| 8124972 | Thin film transistor | Koji Dairiki, Hidekazu Miyairi, Toshiyuki Isa, Takuya Hirohashi, Shunpei Yamazaki +1 more | 2012-02-28 |
| 8115201 | Semiconductor device with oxide semiconductor formed within | Shunpei Yamazaki, Hidekazu Miyairi, Kengo Akimoto, Kojiro Shiraishi | 2012-02-14 |
| 8049225 | Semiconductor device and method for manufacturing the same | Shunpei Yamazaki, Hidekazu Miyairi, Kengo Akimoto, Kojiro Shiraishi | 2011-11-01 |
| 8043939 | Method for manufacturing semiconductor wafer | Shunpei Yamazaki, Ko Inada, Yuji Iwaki | 2011-10-25 |
| 8008693 | Semiconductor thin film and method of manufacturing the same and semiconductor device and method of manufacturing the same | Shunpei Yamazaki, Jun Koyama, Takeshi Fukunaga | 2011-08-30 |
| 7998844 | Method for manufacturing a semiconductor device | Hisashi Ohtani, Takeshi Fukunaga, Hongyong Zhang | 2011-08-16 |
| 7970200 | Pattern inspection method and apparatus | Teppei Oguni, Tatsuji Nishijima | 2011-06-28 |
| 7943930 | Semiconductor device forming method | Hongyong Zhang, Toru Takayama, Yasuhiko Takemura, Hisashi Ohtani | 2011-05-17 |
| 7928438 | Semiconductor thin film and semiconductor device | Shunpei Yamazaki, Hisashi Ohtani, Toru Mitsuki, Yasushi Ogata | 2011-04-19 |
| 7837792 | Method for manufacturing semiconductor device | Hisashi Ohtani, Satoshi Teramoto, Shunpei Yamazaki | 2010-11-23 |
| 7829434 | Method for manufacturing semiconductor wafer | Shunpei Yamazaki, Ko Inada, Yuji Iwaki | 2010-11-09 |
| 7812351 | Thin film semiconductor device and its manufacturing method | Shunpei Yamazaki, Jun Koyama, Takeshi Fukunaga | 2010-10-12 |
| 7769226 | Pattern inspection method and apparatus | Teppei Oguni, Tatsuji Nishijima | 2010-08-03 |
| 7767559 | Process for fabricating semiconductor device | Hisashi Ohtani, Takeshi Fukunaga | 2010-08-03 |
| 7749819 | Method for manufacturing semiconductor device | Hisashi Ohtani, Hongyong Zhang, Naoaki Yamaguchi | 2010-07-06 |
| 7700421 | Semiconductor device and method for manufacturing the same | Hisashi Ohtani, Yasuhiko Takemura | 2010-04-20 |
| 7687855 | Semiconductor device having impurity region | Nobuo Kubo | 2010-03-30 |