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Image sensors with multiple column output lines per column |
Stephen J. Spinks, Nicholas P. Cowley |
2025-08-12 |
| 12256162 |
Reference pixel column readout |
Nicholas P. Cowley |
2025-03-18 |
| 12225304 |
Expanded image sensor pixel array |
Nicholas P. Cowley |
2025-02-11 |
| 11985441 |
Methods and apparatus for an image sensor |
Nicholas P. Cowley |
2024-05-14 |
| 11876954 |
Stitched integrated circuit dies |
Nicholas P. Cowley |
2024-01-16 |
| 11721710 |
Stitched integrated circuit dies |
Nicholas P. Cowley |
2023-08-08 |
| 11671724 |
Systems and methods for mitigating global event power surge in image sensors |
Nicholas P. Cowley |
2023-06-06 |
| 11606521 |
Image sensors with reduced peak power |
Nicholas P. Cowley |
2023-03-14 |
| 11595607 |
Image sensors with variable read out circuitry |
Nicholas P. Cowley, Mukesh Rao ENGLA SYAM |
2023-02-28 |
| 11457166 |
Methods and apparatus for an image sensor |
Nicholas P. Cowley |
2022-09-27 |
| 11438574 |
Stitched integrated circuit dies |
Nicholas P. Cowley |
2022-09-06 |
| 9819753 |
System and method for logging and reporting mobile device activity information |
Sarah Hernandez, Mitchell Scott Ozer |
2017-11-14 |
| 9577523 |
Dual mode voltage regulator with reconfiguration capability |
Nicholas P. Cowley, Mark Mudd, Stephen J. Spinks, Keith Pinson, Colin L. Perry +5 more |
2017-02-21 |
| 9343963 |
Dual mode voltage regulator with dynamic reconfiguration capability |
Nicholas P. Cowley, Isaac Ali, Keith Pinson, Colin L. Perry, Matthew T. Aitken +5 more |
2016-05-17 |
| 9154901 |
System and method for disabling and enabling mobile device functional components |
Sarah Hernandez, Choongil Fleischman |
2015-10-06 |
| 8866650 |
Apparatus, systems and methods for for digital testing of ADC/DAC combination |
Stephen J. Spinks, Colin Mair |
2014-10-21 |
| 8412647 |
Behavior monitoring system and method |
Scott Hotes, Tasos Roumeliotis |
2013-04-02 |
| 7449871 |
System for setting an electrical circuit parameter at a predetermined value |
Keith L. Jones |
2008-11-11 |
| 5833479 |
Surface mount test point enabling hands-free diagnostic testing of electronical circuits |
— |
1998-11-10 |