Issued Patents All Time
Showing 26–30 of 30 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 5378429 | Corrosive environment sensor, corrosive environment measuring apparatus and corrosive environment control system | Makoto Hayashi, Satoshi Kanno | 1995-01-03 |
| 5366922 | Method for producing CMOS transistor | Kenji Aoki | 1994-11-22 |
| 5338697 | Doping method of barrier region in semiconductor device | Kenji Aoki, Tadao Akamine | 1994-08-16 |
| 5317925 | Double-cantilever beam type test piece and corrosive environmental crack growth measuring apparatus | Makoto Hayashi, Satoshi Kanno | 1994-06-07 |
| 5124272 | Method of producing field effect transistor | Kenji Aoki, Tadao Akamine, Yoshikazu Kojima, Kunihiro Takahashi, Masahiko Kinbara | 1992-06-23 |