Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12124357 | System and method for test selection according to test impact analytics | Alon Eizenman, Alon Weiss, Nadav Yeheskel, Amir Schwartz, Eran Sher | 2024-10-22 |
| 11573885 | System and method for test selection according to test impact analytics | Alon Eizenman, Alon Weiss, Nadav Yeheskel, Amir Schwartz, Eran Sher | 2023-02-07 |