Issued Patents All Time
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11650167 | Abnormal surface pattern detection for production line defect remediation | Jun Lee Kok, Bak Leng Lim, Yen Ling Lim | 2023-05-16 |
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11650167 | Abnormal surface pattern detection for production line defect remediation | Jun Lee Kok, Bak Leng Lim, Yen Ling Lim | 2023-05-16 |