| 12229933 |
Method for grain size analysis |
Sha Zhu, Cindy NG, Caiyan Lu |
2025-02-18 |
| 10234400 |
Feature detection with light transmitting medium |
Joachim Walter Ahner, Florin Zavaliche, David M. Tung, Samuel Kah Hean Wong, Henry Luis Lott +1 more |
2019-03-19 |
| 10024790 |
Imaging a transparent article |
Joachim Walter Ahner, David M. Tung, Samuel Kah Hean Wong, Henry Luis Lott, Stephen Keith McLaurin +1 more |
2018-07-17 |
| 9863892 |
Distinguishing foreign surface features from native surface features |
Joachim Walter Ahner, David M. Tung, Samuel Kah Hean Wong, Henry Luis Lott, Stephen Keith McLaurin +1 more |
2018-01-09 |
| 9810633 |
Classification of surface features using fluoresence |
Joachim Walter Ahner, David M. Tung, Samuel Kah Hean Wong, Henry Luis Lott, Stephen Keith McLaurin +1 more |
2017-11-07 |
| 9784688 |
Apparatus for uniformly irradiating and imaging an article |
Joachim Walter Ahner, David M. Tung, Samuel Kah Hean Wong, Henry Luis Lott, Stephen Keith McLaurin +1 more |
2017-10-10 |
| 9766179 |
Chemical characterization of surface features |
Joachim Walter Ahner, Samuel Kah Hean Wong, Henry Luis Lott, David M. Tung, Florin Zavaliche +1 more |
2017-09-19 |
| 9377394 |
Distinguishing foreign surface features from native surface features |
Joachim Walter Ahner, David M. Tung, Samuel Kah Hean Wong, Henry Luis Lott, Stephen Keith McLaurin +1 more |
2016-06-28 |
| 9297759 |
Classification of surface features using fluorescence |
Joachim Walter Ahner, David M. Tung, Samuel Kah Hean Wong, Henry Luis Lott, Stephen Keith McLaurin +1 more |
2016-03-29 |
| 9297751 |
Chemical characterization of surface features |
Joachim Walter Ahner, Samuel Kah Hean Wong, Henry Luis Lott, David M. Tung, Florin Zavaliche +1 more |
2016-03-29 |
| 8395863 |
Laminated contact pad for a transducer head |
Jeremy Adam Thurn, Ibro Tabakovic, Brian William Karr, Kurt W. Wierman, Joachim Walter Ahner |
2013-03-12 |
| 7541105 |
Epitaxial ferroelectric and magnetic recording structures including graded lattice matching layers |
Thomas F. Ambrose, Joachim Walter Ahner, Kai-Chieh Chang, Robert D. Hempstead, Mark Ian Lutwyche |
2009-06-02 |