Issued Patents All Time
Showing 1–13 of 13 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9809887 | Method of patterning a stack | Michael Feldbaum, David S. Kuo, Gennady Gauzner, Kim Y. Lee, Li-Ping Wang | 2017-11-07 |
| 9638995 | Method of sheared guiding patterns | Rene Johannes Marinus van de Veerdonk, XiaoMin Yang, Kim Y. Lee | 2017-05-02 |
| 9469525 | Modified surface for block copolymer self-assembly | XiaoMin Yang, Wei-Li Hu, Zhaoning Yu, Kim Y. Lee | 2016-10-18 |
| 9330885 | Method of stack patterning using a ion etching | Michael Feldbaum, David S. Kuo, Gennady Gauzner, Li-Ping Wang | 2016-05-03 |
| 9284649 | Method of patterning a stack | Michael Feldbaum, David S. Kuo, Gennady Gauzner, Kim Y. Lee, Li-Ping Wang | 2016-03-15 |
| 9171703 | Apparatus with sidewall protection for features | Shuaigang Xiao, David S. Kuo, Kim Y. Lee, XiaoMin Yang | 2015-10-27 |
| 8946835 | Magnetic device with different planarization areas | Yuan Xu, Wei-Li Hu, Gene Gauzner, Koichi Wago, David S. Kuo | 2015-02-03 |
| 8792201 | Method of disc alignment using printed alignment marks | Gennady Gauzner, David S. Kuo, Li-Ping Wang, Zhaoning Yu, Kim Y. Lee | 2014-07-29 |
| 8308964 | Planarization method for media | Yuan Xu, Wei-Li Hu, Gene Gauzner, Koichi Wago, David S. Kuo | 2012-11-13 |
| 7783101 | Method and system for determining dimensions of a structure having a re-entrant profile | — | 2010-08-24 |
| 7454828 | Method for manufacturing a magnetic write head | Sukhbir Singh Dulay, Thao Pham | 2008-11-25 |
| 7323350 | Method of fabricating thin film calibration features for electron/ion beam image based metrology | Sukhbir Singh Dulay, Thao Pham | 2008-01-29 |
| 6929961 | Dual function array feature for CMP process control and inspection | Thomas L. Leong | 2005-08-16 |