Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11216936 | Defect detection device, defect detection method, and program | Yasushi Nagata, Hiroyuki Onishi | 2022-01-04 |
| 11199509 | Inspection apparatus and inspection method | Shohei Otsuki | 2021-12-14 |