Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9546967 | Apparatus and method for identifying defects within the volume of a transparent sheet and use of the apparatus | Bruno Schrader, Frank Macherey, Holger Wegener | 2017-01-17 |
| 9157869 | Method and device for detecting cracks in semiconductor substrates | Andreas Ortner, Klaus Gerstner, Hilmar Von Campe | 2015-10-13 |
| 8233697 | Method and device for generating digital still pictures of wafer-shaped elements during a production process | — | 2012-07-31 |
| 7521670 | Standard for referencing luminescence signals | Axel Engel, Rainer Haspel, Ute Resch-Genger, Katrin Hoffmann, Doris Ehrt +2 more | 2009-04-21 |