Issued Patents All Time
Showing 101–117 of 117 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7170788 | Last-first mode and apparatus for programming of non-volatile memory with reduced program disturb | Jeffrey W. Lutze | 2007-01-30 |
| 7119612 | Dual-channel instrumentation amplifier | Peter R. Holloway | 2006-10-10 |
| 7075353 | Clock generator circuit stabilized over temperature, process and power supply variations | Peter R. Holloway | 2006-07-11 |
| 7075360 | Super-PTAT current source | Peter R. Holloway | 2006-07-11 |
| 7075475 | Correlated double sampling modulation system with reduced latency of reference to input | — | 2006-07-11 |
| 7023737 | System for programming non-volatile memory with self-adjusting maximum program loop | Jeffrey W. Lutze | 2006-04-04 |
| 7015744 | Self-regulating low current watchdog current source | Peter R. Holloway | 2006-03-21 |
| 7015732 | Power-on reset circuit with low standby current and self-adaptive reset pulse width | Peter R. Holloway | 2006-03-21 |
| 7009889 | Comprehensive erase verification for non-volatile memory | Dat Tran, Kiran Ponnuru, Jian Chen, Jeffrey W. Lutze | 2006-03-07 |
| 6962436 | Digitizing temperature measurement system and method of operation | Peter R. Holloway, Eric D. Blom, Stuart H. Urie | 2005-11-08 |
| 6957910 | Synchronized delta-VBE measurement system | Peter R. Holloway, Gary E. Sheehan | 2005-10-25 |
| 6930495 | Digitizing ohmmeter system | Eric D. Blom, Peter R. Holloway, Stuart H. Urie | 2005-08-16 |
| 6903558 | Digitizing ohmmeter system | Eric D. Blom, Peter R. Holloway, Stuart H. Urie | 2005-06-07 |
| 6869216 | Digitizing temperature measurement system | Peter R. Holloway, Eric D. Blom, Stuart H. Urie | 2005-03-22 |
| 6831504 | Constant temperature coefficient self-regulating CMOS current source | Peter R. Holloway, Eric D. Blom | 2004-12-14 |
| 6750796 | Low noise correlated double sampling modulation system | Peter R. Holloway, Eric D. Blom | 2004-06-15 |
| 6736540 | Method for synchronized delta-VBE measurement for calculating die temperature | Gary E. Sheehan | 2004-05-18 |