Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11243232 | Test apparatuses including probe card for testing semiconductor devices and operation methods thereof | Gyuyeol Kim | 2022-02-08 |
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11243232 | Test apparatuses including probe card for testing semiconductor devices and operation methods thereof | Gyuyeol Kim | 2022-02-08 |