Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7479793 | Apparatus for testing semiconductor test system and method thereof | Byung-Wook Park, Byeong-Hwan Cho, Bo Yeon Kim | 2009-01-20 |
| 7424406 | Filter characteristic measuring method and system | — | 2008-09-09 |