Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7405090 | Method of measuring an effective channel length and an overlap length in a metal-oxide semiconductor field effect transistor | — | 2008-07-29 |
| 7298160 | Method of measuring gate capacitance by correcting dissipation factor error | Gi-young Yang | 2007-11-20 |