WC

Woosung Choi

Samsung: 20 patents #6,655 of 75,807Top 9%
KAIST: 2 patents #4,169 of 11,619Top 40%
RU Research & Business Foundation Sungkyunkwan University: 1 patents #708 of 1,975Top 40%
Overall (All Time): #188,181 of 4,157,543Top 5%
22
Patents All Time

Issued Patents All Time

Patent #TitleCo-InventorsDate
12390758 Method of manufacturing zeolite-carbon composite and method of treating exhaust gas Ji-man Kim, Hyeonji Moon, Jin Seo Park, Zhengyang Li, Junho Chung +1 more 2025-08-19
12373686 Methods of operating an artificial neural network using a compute-in-memory accelerator and a bitwise activation function Jing Wang, Yen-Kai Lin, Yuanchen Chu 2025-07-29
12256486 Shield structure in electronic device and operation method thereof Jonghyuk Kim, Sangdeok Lee 2025-03-18
12223246 Systems, methods, and computer program products for transistor compact modeling using artificial neural networks Jing Wang 2025-02-11
11537841 System and method for compact neural network modeling of transistors Jing Wang 2022-12-27
11282695 Systems and methods for wafer map analysis Nuo Xu, Fan Chen, Weiyi Qi, Jongchol Kim, Jing Wang +1 more 2022-03-22
11171211 Group IV and III-V p-type MOSFET with high hole mobility and method of manufacturing the same Hong-Hyun Park, Zhengping Jiang, Hesameddin Ilatikhameneh, Chihak Ahn 2021-11-09
11120630 Virtual environment for sharing information Hyuk Kang, Minji Kim, Dongil SON, Buseop JUNG, Jongho Choi +1 more 2021-09-14
11027256 Amine-based carbon dioxide adsorbent resistant to oxygen and sulfur dioxide and method of preparing the same Minkee Choi, Chaehoon Kim 2021-06-08
11003737 Generic high-dimensional importance sampling methodology Nuo Xu, Jing Wang, Zhengping Jiang 2021-05-11
10654025 Amine-based carbon dioxide adsorbent resistant to oxygen and sulfur dioxide and method of preparing the same Minkee Choi, Chaehoon Kim 2020-05-19
10627446 Importance sampling method for multiple failure regions Nuo Xu, Jing Wang 2020-04-21
10621494 System and method for circuit simulation based on recurrent neural networks Nuo Xu, Zhengping Jiang, Weiyi Qi, Jing Wang 2020-04-14
10330727 Importance sampling method for multiple failure regions Nuo Xu, Jing Wang 2019-06-25
10204188 Systems, methods and computer program products for analyzing performance of semiconductor devices Jing Wang, Nuo Xu 2019-02-12
10146896 Method for transistor design with considerations of process, voltage and temperature variations Jing Wang, Nuo Xu 2018-12-04
10069013 Amplifiers including tunable tunnel field effect transistor pseudo resistors and related devices Nuo Xu, Jing Wang 2018-09-04
10032260 Inverse distortion rendering method based on a predicted number of surfaces in image data Jungeun Lee 2018-07-24
9728639 Tunnel field effect transistors having low turn-on voltage Nuo Xu, Jing Wang 2017-08-08
9526436 Amplifiers including tunable tunnel field effect transistor pseudo resistors and related devices Nuo Xu, Jing Wang 2016-12-27
8766348 Semiconductor device with selectively located air gaps and method of fabrication Tae Kyung Kim 2014-07-01
8730732 Semiconductor memory device and method of fabrication and operation Sung Min Hong, Tae Kyung Kim 2014-05-20