Issued Patents All Time
Showing 1–19 of 19 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10318469 | Semiconductor memory device, memory system, and method using bus-invert encoding | Min Jang, Gong-Heum Han, Chul-Sung Park, Jang-Woo Ryu, Chang-Yong Lee | 2019-06-11 |
| 9588840 | Memory devices that perform masked write operations and methods of operating the same | Hoi-Ju Chung, Chul-Sung Park, Tae Young Oh, Jang-Woo Ryu, Chan Yong Lee +1 more | 2017-03-07 |
| 9164834 | Semiconductor memory devices, memory systems including the same and method of writing data in the same | Hoi-Ju Chung, Chul-Sung Park, Jae Wook Lee, Jang-Woo Ryu, Gong-Heum Han | 2015-10-20 |
| 9036439 | Semiconductor memory device having improved refresh characteristics | Jung Sik Kim, Cheol Kim, Sang Ho Shin, Jung-Bae Lee, Chan Yong Lee +2 more | 2015-05-19 |
| 7315483 | Circuit for selecting a power supply voltage and semiconductor device having the same | — | 2008-01-01 |
| 6950365 | Semiconductor memory device having bitline coupling scheme capable of preventing deterioration of sensing speed | Sung-Ho Choi | 2005-09-27 |
| 6590434 | Delay time controlling circuit and method for controlling delay time | Hoe-Ju Chung, Kyu-hyoun Kim | 2003-07-08 |
| 6514293 | Prosthetic foot | Dong Hee Lee, Jung Ju Lee, Yong San Yoon | 2003-02-04 |
| 6392909 | Semiconductor memory device having fixed CAS latency in normal operation and various CAS latencies in test mode | Tae-Jin Yoo | 2002-05-21 |
| 6329863 | Input circuit having a fuse therein and semiconductor device having the same | Seung-Hoon Lee | 2001-12-11 |
| 6301170 | MRAD test circuit, semiconductor memory device having the same and MRAD test method | — | 2001-10-09 |
| 6031786 | Operation control circuits and methods for integrated circuit memory devices | Sung Keun Lee | 2000-02-29 |
| 5959936 | Column select line enable circuit for a semiconductor memory device | Dong-Il Seo | 1999-09-28 |
| 5946269 | Synchronous RAM controlling device and method | — | 1999-08-31 |
| 5684748 | Circuit for testing reliability of chip and semiconductor memory device having the circuit | — | 1997-11-04 |
| 5677881 | Semiconductor memory device having a shortened test time and contol method therefor | Dong-Il Seo | 1997-10-14 |
| 5677877 | Integrated circuit chips with multiplexed input/output pads and methods of operating same | Sei Seung Yoon | 1997-10-14 |
| 5579268 | Semiconductor memory device capable of driving word lines at high speed | Dong-Il Seo | 1996-11-26 |
| 5550776 | Semiconductor memory device capable of driving word lines at high speed | Dong-Il Seo | 1996-08-27 |