Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7707471 | Method of defining fault pattern of equipment and method of monitoring equipment using the same | Young-Hak Lee, Won-Soo Choi, Mun Hee Lee | 2010-04-27 |
| 5545076 | Apparatus for gringing a semiconductor wafer while removing dust therefrom | Dong Pyo HONG, Byung Suk Park | 1996-08-13 |