Issued Patents All Time
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6762615 | Parallel test board used in testing semiconductor memory devices | Man-Heung Lee, Chang-Ho Lee, Sang Chul YUN | 2004-07-13 |
| 5479105 | Known-good die testing apparatus | Il Ung Kim | 1995-12-26 |
| 4959814 | Sensing detection circuit in dynamic random access memory | Soo-In Cho | 1990-09-25 |