Issued Patents All Time
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6894480 | Wafer probing test apparatus and method of docking the test head and probe card thereof | — | 2005-05-17 |
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Seung-Gook Back
Overall (All Time): #3,448,935 of 4,157,543Top 85%
1
Patents All Time