Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12205852 | Test method of storage device implemented in multi-chip package (MCP) and method of manufacturing an MCP including the test method | Haengjin Lee, Changseok Han, Taehwan Oh, Minchul Jun, Byeongcheol Choi | 2025-01-21 |