Issued Patents All Time
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9291669 | Semiconductor device, test structure of the semiconductor device, and method of testing the semiconductor device | Jin Lee, Il-Kwon Lee, Jun-Woo Lee, Kyoung Mi Park, In Ae Lee | 2016-03-22 |