Issued Patents All Time
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12282317 | Wafer defect test apparatus, wafer defect test system, wafer test method and fabrication method of a wafer | Sung-hee Lee, Jae Yoon Kim, Jung-Hwan Moon, Jung-Hoon Bak, Kyu Baik Chang +1 more | 2025-04-22 |