Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7496808 | Parallel bit test circuit in semiconductor memory device and associated method | Young Suk Kim | 2009-02-24 |
| 6633504 | Synchronous DRAM having test mode in which automatic refresh is performed according to external address and automatic refresh method | Man Sik Choi | 2003-10-14 |