Issued Patents All Time
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12235635 | Method for setting model threshold of facility monitoring system | Donghwan Kim, Daeyoung Kim, Hyuk Jun Na, Woonkyu Choi | 2025-02-25 |
| 11662718 | Method for setting model threshold of facility monitoring system | Donghwan Kim, Daeyoung Kim, Hyuk Jun Na, Woonkyu Choi | 2023-05-30 |
| 6700648 | Method for controlling a processing apparatus | Chan Hoon Park, Yil Seug Park, Bong Su Cho, Hyun Tai Kang, Jae-Won Hwang +1 more | 2004-03-02 |
| 6211094 | Thickness control method in fabrication of thin-film layers in semiconductor devices | Young-Chul Jang, Bong Su Cho | 2001-04-03 |