Issued Patents All Time
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7514949 | Testing method detecting localized failure on a semiconductor wafer | Joong-Wuk Kang | 2009-04-07 |
| 7094615 | Method of controlling probe tip sanding in semiconductor device testing equipment | Jun Sung KIM, Byung-Wook Choi | 2006-08-22 |
| 6223098 | Control system for semiconductor integrated circuit test process | Ann S. Lee, Jae Young Kim | 2001-04-24 |
| 6055463 | Control system and method for semiconductor integrated circuit test process | Ann S. Lee, Jae Young Kim | 2000-04-25 |