Issued Patents All Time
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9091661 | Method and apparatus for measuring damage to an organic layer of a thin film encapsulation | Na Ri AHN, Kang-Hyun Kim, Jung Hwa PARK | 2015-07-28 |
KY
Ki Young YEON
Overall (All Time): #3,063,012 of 4,157,543Top 75%
1
Patents All Time