Issued Patents All Time
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6286117 | Circuits and methods for testing logic devices by modulating a test voltage with a noise signal | Sung-Jun Yun, Yun Ki Kim, Hyun-deok Park | 2001-09-04 |
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6286117 | Circuits and methods for testing logic devices by modulating a test voltage with a noise signal | Sung-Jun Yun, Yun Ki Kim, Hyun-deok Park | 2001-09-04 |