| 11381231 |
Digital measurement circuit and memory system using the same |
Kwan-Yeob Chae |
2022-07-05 |
| 10977412 |
Integrated circuit including load standard cell and method of designing the same |
Kwan-Yeob Chae |
2021-04-13 |
| 10840896 |
Digital measurement circuit and memory system using the same |
Kwan-Yeob Chae |
2020-11-17 |
| 10756059 |
Semiconductor chip including a plurality of pads |
Kwanyeob Chae, Sanghoon Joo, Jin Ho Choi |
2020-08-25 |
| 10572406 |
Memory controller for receiving differential data strobe signals and application processor having the memory controller |
Ji Hun Oh, Sang-Hune Park, Jin Ho Choi, Dae-ro Kim |
2020-02-25 |
| 10115706 |
Semiconductor chip including a plurality of pads |
Kwanyeob Chae, Sanghoon Joo, Jin Ho Choi |
2018-10-30 |
| 10073619 |
Interface circuits configured to interface with multi-rank memory |
Kwanyeob Chae, Yoonjee Nam, Ji Hun Oh, Shinyoung Yi |
2018-09-11 |
| 9859880 |
Delay cell and delay line having the same |
Kwan-Yeob Chae, Sang Hoon Joo, Sang-Hune Park, Hoon-Koo Lee |
2018-01-02 |
| 9857973 |
Interface circuits configured to interface with multi-rank memory |
Kwanyeob Chae, Yoonjee Nam, Ji Hun Oh, Shinyoung Yi |
2018-01-02 |
| 8766691 |
Duty cycle error accumulation circuit and duty cycle correction circuit having the same |
Ji Hun Oh, Choong-Bin Lim |
2014-07-01 |
| 8493116 |
Clock delay circuit and delay locked loop including the same |
Seong-Ook Jung, Suho Kim, Heechai Kang, Kyungho Ryu |
2013-07-23 |
| 8283958 |
Delay-locked loop and electronic device including the same |
Dong Hwan Lee, Su Ho Kim, Won Jun Lee, Alex Joo, Ji Hun Oh |
2012-10-09 |
| 8049543 |
Delay locked loop, electronic device including the same, and method of operating the same |
Hee Chai Kang, Kyeong Ho Ryu, Seong-Ook Jung, Won Gi Lee, Dong Hwan Lee +1 more |
2011-11-01 |
| 7994835 |
Duty control circuit and semiconductor device having the same |
Kwan-Yeob Chae, Su Ho Kim, Won Young Lee, Sang Hoon Joo, Dharmendra Pandit |
2011-08-09 |
| 7990195 |
Duty cycle correction circuits having short locking times that are relatively insensitive to temperature changes |
Harmendra Panditd, Su Ho Kim, Won Young Lee, Alex Joo, Kwan-Yeob Chae |
2011-08-02 |
