Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9464991 | Method for inspecting polysilicon layer | Alexander Voronov, Suk Ho Lee, Kyung-Hoe Heo, Gyoo-Wan Han | 2016-10-11 |
| 8717555 | Device and method for inspecting polycrystalline silicon layer | Alexander Voronov, Suk Ho Lee, Kyung-Hoe Heo, Gyoo-Wan Han | 2014-05-06 |