Issued Patents All Time
Showing 1–19 of 19 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12331704 | Production process for hydrogen-enriched slush LNG fuel and device | Heuy Dong Kim | 2025-06-17 |
| 11955386 | Method for evaluating defective region of wafer | — | 2024-04-09 |
| 10816567 | Method, apparatus, and computer program for estimating speed of vehicle passing over horizontally grooved road by using acoustic analysis | Young Nae Lee, Nam Kyu Park, Jong Chan Park, Jong Jin Park | 2020-10-27 |
| 10634622 | Method of identifying defect regions in wafer | — | 2020-04-28 |
| 10541181 | Wafer and wafer defect analysis method | — | 2020-01-21 |
| 10325823 | Wafer and wafer defect analysis method | — | 2019-06-18 |
| 9904994 | Method and apparatus for analyzing shape of wafer | Ja Young Kim | 2018-02-27 |
| 7173871 | Semiconductor memory device and method of outputting data strobe signal thereof | Eun-Youp Kong, Jun-Young Jeon | 2007-02-06 |
| 6965528 | Memory device having high bus efficiency of network, operating method of the same, and memory system including the same | Jung-Bae Lee, Dong-Yang Lee | 2005-11-15 |
| 6901018 | Method of generating initializing signal in semiconductor memory device | Il-Man Bae, Jae Hoon Kim | 2005-05-31 |
| 6498766 | Integrated circuit memory devices that utilize indication signals to increase reliability of reading and writing operations and methods of operating same | Dong-Yang Lee | 2002-12-24 |
| 6459651 | Semiconductor memory device having data masking pin and memory system including the same | Dong-Yang Lee | 2002-10-01 |
| 6285225 | Delay locked loop circuits and methods of operation thereof | Yong-Gyu Chu | 2001-09-04 |
| 6058495 | Multi-bit test circuit in semiconductor memory device and method thereof | Hi-Choon Lee | 2000-05-02 |
| 6034916 | Data masking circuits and methods for integrated circuit memory devices, including data strobe signal synchronization | — | 2000-03-07 |
| 5715206 | Dynamic random access memory having sequential word line refresh | Hyung Kyu Lim | 1998-02-03 |
| 5687128 | Power supply voltage boosting circuit of semiconductor memory device | Yong-Sik Seok | 1997-11-11 |
| 5590079 | Wafer burn-in test circuit of a semiconductor memory device | Yong-Sik Seok | 1996-12-31 |
| 5467032 | Word line driver circuit for a semiconductor memory device | — | 1995-11-14 |