Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12265778 | Method of detecting defective layer of semiconductor device and computing system for performing the same | Junghwan Kim, Hyeonhwa Jang, Ghilgeun Oh | 2025-04-01 |
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12265778 | Method of detecting defective layer of semiconductor device and computing system for performing the same | Junghwan Kim, Hyeonhwa Jang, Ghilgeun Oh | 2025-04-01 |