Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11709196 | Method and apparatus for detecting circuit defects | Donggyu Minn, Daehyun Kang, Yonghoon Kim, Jihoon Kim, JeeHo PARK +3 more | 2023-07-25 |
HR
Hyundo RYU
Overall (All Time): #2,596,091 of 4,157,543Top 65%
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Patents All Time