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Hyun-Sub Earm

Samsung: 1 patents #49,284 of 75,807Top 70%
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Patent #TitleCo-InventorsDate
7531792 Analyzing chamber including a leakage ion beam detector and mass analyzer including the same Seung-Se Lee, Young-Dae Kim, Gon-Su Kang, Sung-Yeul An 2009-05-12