HS

Hyeonjin Shin

Samsung: 167 patents #137 of 75,807Top 1%
RU Research & Business Foundation Sungkyunkwan University: 17 patents #11 of 1,975Top 1%
SF Seoul National University R&Db Foundation: 7 patents #35 of 2,771Top 2%
Harvard University: 4 patents #525 of 3,600Top 15%
TC The University Of Chicago: 3 patents #172 of 1,377Top 15%
Overall (All Time): #4,912 of 4,157,543Top 1%
167
Patents All Time

Issued Patents All Time

Showing 26–50 of 167 patents

Patent #TitleCo-InventorsDate
12132133 Avalanche photodetectors and image sensors including the same Sanghyun Jo, Jaeho Lee, Haeryong KIM 2024-10-29
12131905 Graphene structure and method of forming the graphene structure Keunwook Shin, Kyungeun Byun, Soyoung Lee, Changseok LEE 2024-10-29
12127394 Semiconductor devices having buried gates Huijung Kim, Minwoo Kwon, Sangyeon Han, Sangwon Kim, Junsoo Kim +1 more 2024-10-22
12122732 Functionalized polycyclic aromatic hydrocarbon compound and light-emitting device including the same Sangwon Kim, Changsik SONG, Juhyen Lee, Hyejin Cho, Minsu SEOL +1 more 2024-10-22
12103850 Method of forming graphene Van Luan NGUYEN, Keunwook Shin, Changhyun KIM, Changseok LEE, Yeonchoo Cho 2024-10-01
12087818 Transistor including two-dimensional (2D) channel Minhyun LEE, Minsu SEOL 2024-09-10
12080649 Semiconductor memory device and apparatus including the same Minhyun LEE, Changseok LEE, Kyung-Eun BYUN, Hyeonsuk SHIN, Seokmo Hong 2024-09-03
12080595 Method of forming interconnect structure Keunwook Shin, Sanghoon Ahn, Woojin Lee, Kyung-Eun BYUN, Junghoo Shin +1 more 2024-09-03
12062697 Semiconductor device including two-dimensional semiconductor material Minhyun LEE, Minsu SEOL, Yeonchoo Cho 2024-08-13
12061312 Amorphous boron nitride film and anti-reflection coating structure including the same Taejin CHOI, Changseok LEE, Sangwon Kim 2024-08-13
12046656 Semiconductor device including surface-treated semiconductor layer Yeonchoo Cho, Kyung-Eun BYUN 2024-07-23
12040360 Semiconductor device including metal-2 dimensional material-semiconductor contact Minhyun LEE, Haeryong KIM, Seunggeol NAM, Seongjun Park 2024-07-16
12034049 Superlattice structure including two-dimensional material and device including the superlattice structure Minhyun LEE, Jiwoong Park, Saien Xie, Jinseong HEO 2024-07-09
12027589 Semiconductor device including graphene and method of manufacturing the semiconductor device Keunwook Shin, Yeonchoo Cho, Seunggeol NAM, Seongjun Park, Yunseong LEE 2024-07-02
12027588 Field effect transistor including channel formed of 2D material Minhyun LEE, Minsu SEOL, Yeonchoo Cho 2024-07-02
12014991 Interconnect structure including graphene-metal barrier and method of manufacturing the same Keunwook Shin, Kibum Kim, Hyunmi Kim, Sanghun Lee 2024-06-18
12002882 Vertical type transistor, inverter including the same, and vertical type semiconductor device including the same Minhyun LEE, Minsu SEOL, Yeonchoo Cho 2024-06-04
11985910 Memristor and neuromorphic device comprising the same Minhyun LEE, Dovran Amanov, Renjing Xu, Houk Jang, Haeryong KIM +2 more 2024-05-14
11975971 Methods of forming graphene and graphene manufacturing apparatuses Sangwon Kim, Kyung-Eun BYUN, Eunkyu Lee, Changseok LEE 2024-05-07
11978704 Wiring structure and electronic device employing the same Changseok LEE, Seongjun Park, Donghyun Im, Hyun-Ho Park, Keunwook Shin +2 more 2024-05-07
11961898 Method of patterning two-dimensional material layer on substrate, and method of fabricating semiconductor device Van Luan NGUYEN, Minsu SEOL, Junyoung KWON, Minseok YOO, Yeonchoo Cho 2024-04-16
11935790 Field effect transistor and method of manufacturing the same Minsu SEOL, Minhyun LEE, Junyoung KWON, Minseok YOO 2024-03-19
11906291 Method of calculating thickness of graphene layer and method of measuring content of silicon carbide by using XPS Eunkyu Lee, Yeonchoo Cho, Sangwon Kim, Kyung-Eun BYUN, Hyunjae Song 2024-02-20
11908918 Electronic device and method of manufacturing the same Jinseong HEO, Yunseong LEE, Sanghyun Jo, Keunwook Shin 2024-02-20
11894469 Resonant tunneling devices including two-dimensional semiconductor materials and methods of detecting physical properties using the same Sanghyun Jo, Heejun Yang, Shoujun Zheng 2024-02-06