Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 5844914 | Test circuit and method for refresh and descrambling in an integrated memory circuit | Heon Cheol Kim, Chang-Hyun Cho | 1998-12-01 |
HJ
Hong-Sin Jun
Overall (All Time): #3,704,817 of 4,157,543Top 90%
1
Patents All Time