Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6028442 | Test circuit for identifying open and short circuit defects in a liquid crystal display and method thereof | Jin Ho Choi | 2000-02-22 |
| 5844421 | Probe control method for leveling probe pins for a probe test sequence | Si-Hyoung Lee, Seung Hwan Park, Kyoung-Ho Yang | 1998-12-01 |