Issued Patents All Time
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6985830 | Method of measuring the probability of failure caused only by defects, method of measuring defect limited yield, and system using the same | Dae Sung Lee, Jae-cheol Lee, Jung Hee Kim | 2006-01-10 |