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Electronic device |
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2025-06-24 |
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Electronic device having a testing method for determining defects in a sensor layer |
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Noise measuring device and noise measuring method using the same |
Yujin Sin, Jun-Young Ko, Tae Ho Kim |
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Electronic device |
Hyun-Wook Cho, Jaewoo Choi, Taejoon Kim |
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| 11340746 |
Electronic device |
Hyun-Wook Cho, Jaewoo Choi, Taejoon Kim |
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| 10884568 |
Electronic device |
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| 10839730 |
Communication device, display device test system using the same, and display device test method using the communication device |
Jinyoung JEON, Heonseok Lee, Taejoon Kim |
2020-11-17 |