EC

Eun-Ee Cho

Samsung: 1 patents #49,284 of 75,807Top 70%
Overall (All Time): #3,493,786 of 4,157,543Top 85%
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Showing 1–1 of 1 patents

Patent #TitleCo-InventorsDate
6810020 Apparatus and method for measuring bit error rate in an OFDM communication system Ho-Jin Kim, Jong Hyeon Park 2004-10-26