Issued Patents All Time
Showing 1–15 of 15 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12362459 | Electronic device comprising antenna | Shinho YOON, Myeongjun KONG, Seunghwan KIM, Soonho HWANG | 2025-07-15 |
| 12341919 | Antenna and electronic device including the same | Myeongjun KONG, Shinho YOON, Jinwoo Jung, Jaebong CHUN, Soonho HWANG | 2025-06-24 |
| 12327911 | Antenna and electronic device comprising same | Taeik Kim, Haeyeon KIM, Sehyun Park, Shinho YOON, Jonghyuck LEE | 2025-06-10 |
| 12308511 | Antenna and electronic device including the same | Shinho YOON, Myeongjun KONG, Jaebong CHUN, Soonho HWANG | 2025-05-20 |
| 12197254 | Window glass and electronic device including the same | Seungjae Jung, Jeongeun Kim, Sanghoon Han, Byungsun Kim | 2025-01-14 |
| 12046802 | Electronic device including antenna device | Shinho YOON, Jonghyuck LEE, Soonho HWANG | 2024-07-23 |
| 11962068 | Antenna and electronic device comprising same | Taeik Kim, Haeyeon KIM, Sehyun Park, Shinho YOON, Jonghyuck LEE | 2024-04-16 |
| 11880244 | Window glass and electronic device including the same | Seungjae Jung, Jeongeun Kim, Sanghoon Han, Byungsun Kim | 2024-01-23 |
| 11758673 | Electronic device including antenna device | Shinho YOON, Jonghyuck LEE, Taeik Kim, Haeyeon KIM, Soonho HWANG | 2023-09-12 |
| 11664579 | Antenna and electronic device including the same | Jonghyuck LEE, Taeik Kim, Haeyeon KIM, Sehyun Park, Shinho YOON +1 more | 2023-05-30 |
| 11637363 | Electronic device including antenna device | Shinho YOON, Jonghyuck LEE, Soonho HWANG | 2023-04-25 |
| 11462818 | Electronic device including antenna device | Shinho YOON, Jonghyuck LEE, Soonho HWANG | 2022-10-04 |
| 11432418 | Electronic device including antenna device | Shinho YOON, Jonghyuck LEE, Taeik Kim, Haeyeon KIM, Soonho HWANG | 2022-08-30 |
| 11139554 | Electronic device including antenna device | Shinho YOON, Jonghyuck LEE, Soonho HWANG | 2021-10-05 |
| 11088138 | Semiconductor device for testing characteristics of transistors and method for testing semiconductor device | Hideok Lee, Sungkyu Kwon, Hyeongsub Song, Soyeong Kim | 2021-08-10 |