Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12282249 | Full-chip cell critical dimension correction method and method of manufacturing mask using the same | Kisung Kim, Heejun Lee, Dongho Kim | 2025-04-22 |
DW
Donggon WOO
Overall (All Time): #2,407,672 of 4,157,543Top 60%
1
Patents All Time